Characterization of Low Temperature GaAs
- Author(s):
Tadayon, B. Twigg, M. Fatemi, M. Frankel, M. Giordana, A. Katzer, D.S. - Publication title:
- Proceedings of the Twenty-first State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI)
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 1994-34
- Pub. Year:
- 1994
- Page(from):
- 289
- Page(to):
- 294
- Pages:
- 6
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770934 [1566770939]
- Language:
- English
- Call no.:
- E23400/950719
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
ELECTRICAL CHARACTERIZATION OF LOW TEMPERATURE GaAs LAYERS, AND OBSERVATION OF THE EXTREMELY LARGE CARRIER CONCENTRATIONS IN INDOPED MATERIAL
Materials Research Society |
Materials Research Society |
Materials Research Society |
9
Conference Proceedings
Bonded Polycrystalline SiC Substrates for the Growth and Fabrication of GaN FETs
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
11
Conference Proceedings
Relaxation Mechanisms of Strained SiGe Films Bonded to High and Low Viscosity Oxides
Electrochemical Society |
6
Conference Proceedings
GaAs metal-semiconductor-metal photodector mixers for microwave single-sideband modulation
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Structural Characterization of 3C-SiC Films Grown on Si Layers Wafer Bonded to Polycrystalline SiC Substrates
Materials Research Society |