The Relative Sensitivity to Dislocation Loops in Silicon of Brightfield Interferometric Profiling
- Author(s):
Siriwardane, H. Holzer, J.C. Hill, D.E. Mulestagno, L. Shaw, R.W. Fraundorf, P. - Publication title:
- Proceedings of the Symposium on Diagnostic Techniques for Semiconductor Materials and Devices
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 1994-33
- Pub. Year:
- 1994
- Page(from):
- 266
- Page(to):
- 276
- Pages:
- 11
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770927 [1566770920]
- Language:
- English
- Call no.:
- E23400/951106
- Type:
- Conference Proceedings
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