Blank Cover Image

7 Scanning force microscopy investigations of photoresists

Author(s):
Publication title:
Proceedings of the Second International Symposium on Electrochemical Microfabrication
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-32
Pub. Year:
1994
Page(from):
75
Page(to):
87
Pages:
13
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770910 [1566770912]
Language:
English
Call no.:
E23400/950718
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Friction Force Microscopy

Meyer E., Luthi R., Howald L., Guntherodt -J. H.

Kluwer Academic Publishers
7 Conference Proceedings FRICTION FORCE MICROSCOPY OF LANGMUIR-BLODGETT FILMS

Meyer E., Overney r., Howald L., BroabecK D., Luthi R., Guntherodt -J. H.

Kluwer Academic Publishers
2 Conference Proceedings Force Microscopy

Heinzelmann. H, Meyer. E, Rudin. H, Guntherodt. J. H

Kluwer Academic Publishers
8 Conference Proceedings Instrumental Aspects and Contrast Mechanisms of Friction Force Microscopy

Meyer E., Luthi R., Howald L., Bammerlin M., Guggisburg M., Guntherodt -J. H.

Kluwer Academic Publishers
3 Conference Proceedings Forces in Scanning Probe Microscopy

Meyer E., Hug J. H., Luthi R., Stiefel B., Guntherodt -J. H.

Kluwer Academic Publishers
9 Conference Proceedings Effect of development process time on the surface of photoresist with various chemical compositions investigated by atomic force microscopy

Ko,C.H., Oh,S.-H., Kim,J.-H., Song,C.-L., Lee,S.-I.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings New developments in scanning probe microscopy

MEYER. E, GUGGISBERG. M, LOPPACHER. CH, BATTISTON. F, GYALOG. T, BAMMERLIN. M, BENNEWITZ, R, LU. J, LEHMANN. T, …

Kluwer Academic Publishers
10 Conference Proceedings Low Temperature Scanning Force Microscopy

Hug J. H., Moser A., Frits O., Stiefel B., Parashikov I.

Kluwer Academic Publishers
5 Conference Proceedings Resolution limits of force microscopy

Luthi, R., Meyer, E., Bammerlin, M., Baratoff, A., Lu, J., Guggisberg, M., Guntherodt, H.-J.

American Chemical Society
11 Conference Proceedings Chemically Sensitive Scanning Force Microscopy

Wong, S.-S., Yakano, H., Harnisch, J., Porter, M.

Electrochemical Society
6 Conference Proceedings The Application of Scanning Tunneling Microscopy to Electrochemistry

Kolb M. D., Nichols J. R., Behm J. R.

Kluwer Academic Publishers
12 Conference Proceedings ARTIFACTS IN ATOMIC FORCE MICROSCOPY OF NANOPOROUS AND MESOPOROUS FIDUCIAL SAMPLES

Deckman, H.W., Plano, R.J.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12