Hot Carrier Degradation in Submicron CMOS Technologies: A Comparative Study

Hot Carrier Degradation in Submicron CMOS Technologies: A Comparative Study

Author(s):

Publication title:

Proceedings of the Third International Symposium on Corrosion and Reliability of Electronic Materials and Devices

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

1994-29

Pub. Year:

1994

Page(from):

277

Page(to):

285

Pages:

9

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566770880 [1566770882]

Language:

English

Call no.:

E23400/950680

Type:

Conference Proceedings

Details

TDL ID:	ZA00014138
Series ID:	PA00000028
Conf. info. (Name):	International Symposium on Corrosion and Reliability of Electronic Materials and Devices
Conf. info. (Number):	3rd
Conf. info. (Venue):	Miami Beach, Florida, USA
Conf. info. (Date):	1994.10.09-1994.10.14

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