Blank Cover Image

IMPROVED ENVIRONMENTAL TESTING OF REI GASKETS

Author(s):
Peregrim, W.D.  
Publication title:
Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1993-1
Pub. Year:
1993
Page(from):
529
Page(to):
540
Pages:
12
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770514 [1566770513]
Language:
English
Call no.:
E23400/930160
Type:
Conference Proceedings

Similar Items:

Peregrim, W. D.

Electrochemical Society

Meikrantz, D.H., Macaluso, L.L., Flim, W.D.

American Institute of Chemical Engineers

Marscher,W.D.

SPIE - The International Society for Optical Engineering

van Amstel,W.D., Baumer,S.M.B., Horijon,J.L.

SPIE - The International Society for Optical Engineering

Cuta,J.M., Bennett,W.D., McDonald,C.E., Ravigururajan,T.S.

SPIE-The International Society for Optical Engineering

Jacoby, M.T., Goodman, W.A., Stahl, H.P., Keys, A.S., Reily, J.C., Eng, R., Hadaway, J.B., Hogue, W.D., Kegley, J.R., …

SPIE - The International Society of Optical Engineering

Y.C. Chen, G. Yang, R. Zhao, W.D. Xue

Trans Tech Publications

Ulrich, R.K., Zhao, G., Brown, W.D.

American Institute of Chemical Engineers

Armstrong, W.D.

SPIE-The International Society for Optical Engineering

Ultich, R.K., Zhao, G., Brown, W.D.

American Institute of Chemical Engineers

12 Conference Proceedings Sensor resolution

Blair, W.D.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12