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Fabrication Characteristics of Midgap Metal Gates Compatible With Thin SiO2 Films Using Low Pressure Chemically Vapor Deposited Tungsten Films

Author(s):
Kouvatsos, D.N.
Ioannou-Sougleridis, V.
Tsevas, S.
Davazoglou, D.
Christoforou, F.
Boukouras, C.
1 more
Publication title:
Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-8
Pub. Year:
2003
Page(from):
1364
Page(to):
1371
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773782 [1566773784]
Language:
English
Call no.:
E23400/200308
Type:
Conference Proceedings

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