Sub-Quarter Micron PMOSFET DC and AC NBTI Degradation

Sub-Quarter Micron PMOSFET DC and AC NBTI Degradation

Author(s):

Publication title:

ULSI Process Integration : proceedings of the International Symposium

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

2003-6

Pub. Year:

2003

Page(from):

408

Page(to):

420

Pages:

13

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566773768 [1566773768]

Language:

English

Call no.:

E23400/200306

Type:

Conference Proceedings

Details

TDL ID:	ZA00014069
Series ID:	PA00000028
Conf. info. (Name):	International Symposium on ULSI Process Integration ; Meeting of the Electrochemical Society
Conf. info. (Number):	3rd ; 203rd
Conf. info. (Venue):	Paris, France
Conf. info. (Date):	2003.04.28-2003.05.02

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