What Can Low-frequency Noise Learn us About the Quality of Thin-gate Dielectrics?
- Author(s):
- Publication title:
- Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2003-2
- Pub. Year:
- 2003
- Page(from):
- 153
- Page(to):
- 172
- Pages:
- 20
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773478 [1566773474]
- Language:
- English
- Call no.:
- E23400/200302
- Type:
- Conference Proceedings
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