Grown-in Defects in Nitrogen Doped Czochralski Silicon*
- Author(s):
- Publication title:
- High purity silicon VII : proceedings of the international symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2002-20
- Pub. Year:
- 2002
- Page(from):
- 105
- Page(to):
- 118
- Pages:
- 14
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773447 [156677344X]
- Language:
- English
- Call no.:
- E23400/200220
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Oxygen Precipitation of Nitrogen-Doped Czochralski Silicon Subjected to Multi-Step Thermal Process
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Trans Tech Publications |
Electrochemical Society |
10
Conference Proceedings
In-Situ Observations of Point Defect Generation and Complexing During Electron Beam Irradiation of Nitrogen Doped Czochralski Silicon
Electrochemical Society |
Electrochemical Society |
11
Conference Proceedings
EBIC Study of Fe Precipitation on Bulk Stacking Fault in Czochralski-Grown Silicon
MRS - Materials Research Society |
Electrochemical Society, SPIE-The International Society for Optical Engineering |
Electrochemical Society |