Potential Cost of Ownership Reduction for a Nitride Furnace Point of Use Abatement Device
- Author(s):
- Goolsby, B. ( (Motorola) )
- Vartanian, V. ( (Motorola) )
- Mendicino, L. ( (Motorola) )
- Davis, B. ( (Motorola) )
- Rossow, M. ( (Motorola) )
- Publication title:
- Environmental issues with materials and processes for the electronics and semiconductor industries V : proceedings of the international symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2002-15
- Pub. Year:
- 2002
- Page(from):
- 77
- Page(to):
- 86
- Pages:
- 10
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773379 [1566773377]
- Language:
- English
- Call no.:
- E23400/200215
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Point of Use Abatement Unit By-Pass for NF3-Based CVD Chamber Clean Applications
Electrochemical Society |
7
Conference Proceedings
Long-Term Evaluation of a Litmas 'Blue' Inductively-Coupled Plasma Device for Point-of-Use PFC and HFC Abatement
Electrochemical Society |
2
Conference Proceedings
Emissions Characterization of Advanced CVD Processes and Abatement Performance
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
5
Conference Proceedings
The Evaluation of Hexafluoro-1,3-Butadiene as an Environmentally Benign Dielectric Etch Chemistry in a Medium Density Etch Chamber
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
Electrochemical Society |
Electrochemical Society |