Organic contamination on wafers surfaces: measurement techniques and deposition kinetics
- Author(s):
- Publication title:
- Crystalline defects and contamination: their impact and control in device manufacturing III : DECON 2001 : proceedings of the Satellite Symposium to ESSDERC 2001, Nuremberg, Germany
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2001-29
- Pub. Year:
- 2001
- Page(from):
- 294
- Page(to):
- 307
- Pages:
- 14
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773638 [1566773636]
- Language:
- English
- Call no.:
- E23400/200129
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
In-Situ Determination of Si Wafer Contamination Using Photoconductance Decay Measurements*
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
TRACE ANALYSIS OF SILICON SURFACES USING ANGLE- DEPENDENT TOTAL-REFLECTION X-RAY FLUORESCENCE
Electrochemical Society |
8
Conference Proceedings
In-Situ Determination of Si Wafer Contamination Using Photoconductance Decay Measurements
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Wafer scale characterization of interface state densities without test structures by photocurrent analysis
Electrochemical Society |
Electrochemical Society |