Blank Cover Image

The Connection Between oxide leakage currents and Si/SIO2 Interface Trap Generation

Author(s):
Lenahan, P.M.  
Publication title:
Silicon Nitride and Silicon Dioxide Thin Insulating Films : proceedings of the sixth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-7
Pub. Year:
2001
Page(from):
74
Page(to):
79
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773133 [156677313X]
Language:
English
Call no.:
E23400/2001-7
Type:
Conference Proceedings

Similar Items:

Lenahan, P.M., Mele, J., Fattu, M., Lowry, R.K., Woodbury, D.

Electrochemical Society

T. Aichinger, P.M. Lenahan, D. Peters

Trans Tech Publications

Lenahan, P.M., Kang, A.Y., Campbell, J.P.

SPIE-The International Society for Optical Engineering

Conley, J., Lenahan, P.

Electrochemical Society

C.J. Cochrane, P.M. Lenahan, A.J. Lelis

Trans Tech Publications

Warren, W.L., Lenahan, P.M., Brinker, C.J.

Materials Research Society

Lenahan, P.M., Conley, J.F., Wallace, B.D.

Electrochemical Society

C. Strenger, A.J. Bauer, H. Ryssel

Trans Tech Publications

A.F. Basile, S. Dhar, J.R. Williams, L.C. Feldman, P.M. Mooney

Trans Tech Publications

Wong, H., Cheung, N.W.

Materials Research Society

Knaup, J. M., Deak, P., Gali, A., Hajnal, Z., Frauenheim, T., Choyke, J. W.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12