In-Situ Fluorescence Microscopy of Al Thin Film Corrosion at Engineered Cu Islands

In-Situ Fluorescence Microscopy of Al Thin Film Corrosion at Engineered Cu Islands

Author(s):

Publication title:

Corrosion and corrosion prevention of low density metals and alloys : proceedings of the International Symposium

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

2000-23

Pub. Year:

2000

Page(from):

239

Page(to):

246

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566772907 [1566772907]

Language:

English

Call no.:

E23400/200023

Type:

Conference Proceedings

Details

TDL ID:	ZA00013992
Series ID:	PA00000028
Conf. info. (Name):	Symposium on Corrosion of Light Metals ; Meeting of the Electrochemical Society
Conf. info. (Number):	2000 ; 198th
Conf. info. (Venue):	Phoenix, AZ, USA
Conf. info. (Date):	2000.10.23-2000.10.25

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