Detection of Trace Silver and Copper at an Array of Boron-Doped Diamond Microdisk Electrodes

Detection of Trace Silver and Copper at an Array of Boron-Doped Diamond Microdisk Electrodes

Author(s):

Publication title:

Microfabricated Systems and MEMS V : proceedings of the International Symposium

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

2000-19

Pub. Year:

2000

Page(from):

159

Page(to):

168

Pages:

10

Pub. info.:

Pennington, N.J.: Electrochemical Society

ISSN:

01616374

ISBN:

9781566772860 [1566772869]

Language:

English

Call no.:

E23400/200019

Type:

Conference Proceedings

Details

TDL ID:	ZA00013988
Series ID:	PA00000028
Conf. info. (Name):	Microfabricated Systems and MEMS Symposium
Conf. info. (Number):	5th
Conf. info. (Venue):	Phoenix. AZ, USA
Conf. info. (Date):	2000.10.00

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