Knight, T.J., Cheng, X., Krogh, B.H., Greve, D.W., Gibson, M.A.
Electrochemical Society
|
Carbonell, L., Vereecke, G., Van Elshocht, S., Caymax, M., Van Hove, M., Maex, K., Mertens, P.
Electrochemical Society
|
Selim, M.I., Achutan, C., Starr, J.M., Jiang, T., Young, B.S.
American Chemical Society
|
Ross, Mark M., Nelson, H.H., Callahan, J.H., McElvany, S.W.
Materials Research Society
|
Mann M., Shen S., Fenn B. J.
Kluwer Academic Publishers
|
Sannes-Lowery,K.A., Drader,J.J., Griffey,R.H., Hofstadler,S.A.
SPIE-The International Society for Optical Engineering
|
Sadi, Baki B. M., Vonderheide, Anne P., Becker, J. Sabine, Caruso, Joseph A.
American Chemical Society
|
Mendicino, L., Vartanian, V., Gonlsby, B., Brown, P.T., Reid, K., Van Gompel, J.
Electrochemical Society
|
Brett R. Blackwell, M. D. Buser, B. J. Johnson, M. Baker, G. P. Cobb
American Chemical Society
|
Kimble, B. J.
American Chemical Society
|
Carbonell, L., Vereecke, G., Van Elshocht, S., Caymax, M., Van Hove, M., Maex, K., Mertens, P.
SPIE-The International Society for Optical Engineering
|
Cagle, D.W., Alford, J.M., Wilson, L.J.
Electrochemical Society
|