Blank Cover Image

Silica: A Geochemist's Perspective

Author(s):
Rimstidt, J.D.  
Publication title:
The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2000-2
Pub. Year:
2000
Page(from):
217
Page(to):
234
Pages:
18
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772679 [1566772672]
Language:
English
Call no.:
E23400/2000-2
Type:
Conference Proceedings

Similar Items:

Pfautz,J.D.

SPIE-The International Society for Optical Engineering

Rimstidt, J. Donald, Chermak, John A., Gagen, Patrick M.

American Chemical Society

Salt, J.D.

SPIE - The International Society of Optical Engineering

H.J. Kim, S.W. Koh, J.D. Kim, B.T. Kim

Trans Tech Publications

Kendig, M., Scantlebury, J.D., Mills, D.

Electrochemical Society

Pujar, V.V., Cawley, J.D., Hu, P., Lee, L.J.

Materials Research Society

Tolinger,J.D., Milerd,J.E., Weber,D.C., Rosenthal,D.M.

SPIE-The International Society for Optical Engineering

F. Peñafiel, J. Gómez, J.D. Montes, P. Campoy, J. Fernández

Society of Photo-optical Instrumentation Engineers

Tao,K.M., Abileah,R., Lowrance,J.D.

SPIE - The International Society for Optical Engineering

Whichard, G., Mogul, H.C., Weeks, R.A., Stark, J.D., Zuhr, R.

Materials Research Society

S. Arcaro, J.B.R. Neto, F.R. Cesconeto, J.D. Teixeira, F. Raupp-Pereira

Trans Tech Publications

Holdeman, J.D.

National Aeronautics and Space Administration

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12