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Plasma Charge Monitor of In-Situ Pro-Sputter Etch and Metal Deposition Process in a Sputter System

Author(s):
Zhang, X.
Tai, S.
Chen, K-I.
Wong, H.
Chian, B.
Chang, M.
1 more
Publication title:
Plasma etching processes for sub-quarter micron devices : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-30
Pub. Year:
1999
Page(from):
112
Page(to):
123
Pages:
12
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772532 [1566772532]
Language:
English
Call no.:
E23400/99-30
Type:
Conference Proceedings

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