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Super Self-Aligned Processing for Sub 0.1 μm MOS Devices Using Selective Si l-xGexCVD

Author(s):
Kikuchi, T.
Yamashiro, T.
Moriya, A.
Noda, T.
Yamamoto, Y.
Deng, C.
Sakuraba, M.
Matsuura, T.
Murota, J.
4 more
Publication title:
ULSI process integration : proceedings of the first international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-18
Pub. Year:
1999
Page(from):
147
Page(to):
156
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772419 [1566772419]
Language:
English
Call no.:
E23400/99-18
Type:
Conference Proceedings

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