A Model for the Impact of Chamber Wall Condition on Oxide Etch Rate and Particle Performance
- Author(s):
Liu, C-C. Lee, S. Tai, S-K. Tien, Y-C. Hsu, C-F. Su, J. - Publication title:
- Proceedings of the twelfth International Symposium on Plasma Processing
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 98-4
- Pub. Year:
- 1998
- Page(from):
- 165
- Page(to):
- 171
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771986 [1566771986]
- Language:
- English
- Call no.:
- E23400/98-4
- Type:
- Conference Proceedings
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