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Wavelet Analysis of Mass Spectrometry Signals for Transient Event Detection and Run-to-Run Process Control

Author(s):
Rying, E.A.
Gyurcsik, R.S.
Lu, J.C.
Bilbro, G.
Parsons, G.
Sorrell, F.Y.
1 more
Publication title:
Proceedings of the Second International Symposium on Process Control, Diagnostics, and Modeling in Semiconductor Manufacturing
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-9
Pub. Year:
1997
Page(from):
37
Page(to):
44
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771368 [1566771366]
Language:
English
Call no.:
E23400/97-9
Type:
Conference Proceedings

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