Blank Cover Image

Gate-to Drain Capacitance as a Monitor for Hot-Carrier Degradation in Sbmictometer MOSFETs

Author(s):
Ling, C.H.  
Publication title:
Proceedings of the Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
97-10
Pub. Year:
1997
Page(from):
101
Page(to):
117
Pages:
17
Pub. info.:
Pennington, New Jersey: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771375 [1566771374]
Language:
English
Call no.:
E23400/97-10
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Hot carrier degradation of fully depleted SIMOX MOSFETs

Sinha, S P, Ii, F D, loonnou, D E, Jenkins, W C, Hughes, H L, Lin, M S

Electrochemical Society
7 Conference Proceedings Hot-Carrier Properties of Sub-Micron MOSFETs with NO-Annealed Gate Oxides

Yao, Z.-Q., Ghodsi, R., Harrison, H.B., Dimitrijev, S., Yeow, T.Y.

Electrochemical Society
2 Conference Proceedings Hot Carrier Reliability of ALD HfSiON Gated MOSFETs with Different Compositions

H. Chen, S. Chen, C. Lu, C. Liu, F. Chiu

Electrochemical Society
8 Conference Proceedings Plasma Charging Damages for Gate Oxide and Hot-Carrier Degradation and Electro-migration Properties in Cu Interconnects

So, D.S., Wang, J.J., Yang, C.T., Chen, D.H, Theng, H.C., Chen, H., Lee, S.Y.

Electrochemical Society
3 Conference Proceedings Channel Hot Carrier Stress of Oxynitrided-Gate MOSFETs

Nguyen, K., Lee, S., Kahrizi, M., Landsberger, L., Belkouch, S., Jean, C.

Electrochemical Society
9 Conference Proceedings THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S

Wolf, Ingrid De, Bellens, Rudi, Groeseneken, Guido, Maes, Herman E.

MRS - Materials Research Society
4 Conference Proceedings A Steady-state Ramp Method for Carrier Lifetime Measurement in the SOI MOSFET

Cheng, Z-Y, Ling, C H

Electrochemical Society
10 Conference Proceedings THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S

Wolf, Ingrid De, Bellens, Rudi, Groeseneken, Guido, Maes, Herman E.

MRS - Materials Research Society
5 Conference Proceedings Edge and Floating Body Effects on Hot-Carrier-Induced Degradation in FD SOT n-MOSFETs

Renn, S H, Szelag, B, Balestra, F, Raynaud, C

Electrochemical Society
11 Conference Proceedings Interdependence and Significance of Hot Carrier Stress (HCS) and Gate Induced (GIDL) Drain Leakage Current in BC SOT pMOSFETs

Zhao, X, Ioannou, D, Jenkins, W, Hughes, H, Liu, S T

Electrochemical Society
6 Conference Proceedings On the Effects of Carrier Tunneling on the Capacitance-Voltage Characteristics of Ultrathia-Oxide MOSFETs

M. Y. C. Shea, J. Jopling, H. Z. Massoud

Electrochemical Society
12 Conference Proceedings Observation of Bulk-Trap Induced Generation-Recombination Noise in the Fully Depleted SOI MOSFET

Lun, Z., Ang, D.S., Ling, C.H.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12