Blank Cover Image

Process Dependence of Notching: Simulation of Topography De- pendent Charging with Sheath Oscillation Effect

Author(s):
Publication title:
Proceedings of the eleventh International Symposium on Plasma Processing
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-12
Pub. Year:
1996
Page(from):
49
Page(to):
60
Pages:
12
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771641 [1566771641]
Language:
English
Call no.:
E23400/962354
Type:
Conference Proceedings

Similar Items:

Hane, M., Kinoshita, T., McVittie, J.P.

Electrochemical Society

Brinkmann, R.P., Hsiau, K., Zheng, J., McVittie, J.P.

Electrochemical Society

McVittie, J.P.

Electrochemical Society

Murakawa, S., Fang, S., McVittie, J.P.

Electrochemical Society

Abdel-Ati, W.L.N., Ma, S., Yang, T.-C., McVittie, J.P., Saraswat, K.C.

Electrochemical Society

Ma, S., McVittie, J.P.

Electrochemical Society

Tosic, B.S., Setrajcic, J.P., Sajfert, V.D., Vucenovic, S.M., Mirjanic, D.L., Jacimovski, S.K.

Trans Tech Publications

Zheng, J., McVittie, J.P.

Electrochemical Society

Li, J., McVittie, J.P., Ferziger, J., Saraswat, K.C., Schmidt, M., Dobkin, D.

Electrochemical Society

McVittie, J.P., Murakawa, S.

Electrochemical Society

McVittie, J.P., Lin, T.A., Bariya, A.J.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12