Blank Cover Image

Effect of Stress on Point and Extended Defects in Silicon

Author(s):
Publication title:
Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-4
Pub. Year:
1996
Page(from):
407
Page(to):
416
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771542 [1566771544]
Language:
English
Call no.:
E23400/961823
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Effect of Arsenic on Extended Defect Evolution in Silicon

Brindos, R., Jones, K.S., Law, M.E

Materials Research Society
7 Conference Proceedings Nucleation and Growth of Extended Defects in Silicon

Pantelides, S.T., Ramamoorthy, M., Reboredo, F.A.

Electrochemical Society
2 Conference Proceedings Point and Extended Defect Interactions in Silicon

Law, M. E., Earles, S. K.

MRS - Materials Research Society
8 Conference Proceedings Point Defect Interactions With Extended Defects in Silicon

Justo, J. F., Antonelli, A., Fazzio, A.

MRS - Materials Research Society
3 Conference Proceedings Modeling of Extended Defects in Silicon

Law, M. E., Jones, K. S., Earles, S. K., Lilak, A. D., Xu, J-W.

MRS - Materials Research Society
9 Conference Proceedings High resolution EELS study of extended defects in silicon

Kohno,H., Arai,N., Mabuchi,T., Hirata,M., Takeda,S., Kohyama,M., Terauchi,M., Tanaka,M.

Trans Tech Publications
4 Conference Proceedings Modeling of Extended Defects in Silicon

Law, M. E., Jones, K. S., Earles, S. K., Lilak, A. D., Xu, J-W.

MRS - Materials Research Society
10 Conference Proceedings Point-Defect Migration in Crystalline Silicon: Impurity Content, Surface and Stress Effects

Coffa, S., Libertino, S., Magna, A. La, Privitera, V., Mannino, G., Priolo, F.

MRS - Materials Research Society
5 Conference Proceedings INTERACTION OF POINT AND EXTENDED DEFECTS IN SILICON: THEIR INFLUENCE ON THE POLYCRYSTALLINE SILICON SUBSTRATE QUALITY FOR HIGH EFFICIENCY SOLAR CELLS

Pizzini, S., Acciarri, M., Binetti, S., Acerboni, S., Savigni, C.

Electrochemical Society
11 Conference Proceedings The Extended Nature of Point-Like Defects in Silicon

Cerofolini F. G.

Plenum Press
6 Conference Proceedings Effect of Extended Defects on the Enhanced Diffusion of Phosphorus Implanted Silicon

Keys, P. H., Li, J. H., Heitman, E., Packan, P. A., Law, M. E., Jones, K. S.

MRS - Materials Research Society
12 Conference Proceedings Extended Defects in 4H-SiC PiN Diodes

Twigg, M.E., Stahlbush, R.E., Fatemi, M., Arthur, S.D., Fedison, J.B., Tucker, J.B., Wang, S.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12