Blank Cover Image

Room Temperature Photoluminescence from Manufactured 1-D Si Grating Structures

Author(s):
Publication title:
Proceedings of the International Symposium on Advanced Luminescent Materials
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
95-25
Pub. Year:
1995
Page(from):
307
Page(to):
316
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771207 [156677120X]
Language:
English
Call no.:
E23400/961822
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Nanoscale fabrication by interferometric lithography

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings SCALABLE FABRICATION AND OPTICAL CHARACTERIZATION OF nm Si STRUCTURES

Zaidi, Saleem H., Chu, An-Shyang, Brueck, S. R. J.

MRS - Materials Research Society
2 Conference Proceedings Interferometric lithography for nanoscale fabrication

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering
8 Conference Proceedings Interferometric lithography exposure tool for 180-nm structures

Zaidi,S.H., Brueck,S.R.J., Schellenberg,F.M., Mackay,R.S., Uekert,K., Persoff,J.J.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Nonlinear processes to extend interferometric lithography

Zaidi,S.H., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Sub-Feature Speckle Interferometry: A New Approach to Temperature Measurement

Burckel, D., Zaidi, S. H., Brueck, S. R. J.

MRS - Materials Research Society
4 Conference Proceedings Mix-and-match interferometric and optical lithographies for nanoscale structures

Zaidi,S.H., Brueck,S.R.J., Hill,T.A., Shagam,R.N.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Toward accurate linewidth metrology using atomic force microscopy and tip characterization

Dixson,R., Schneir,J., McWaid,T.H., Sullivan,N.T., Tsai,V.W., Zaidi,S.H., Brueck,S.R.J.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Characterization of Si nanostructured surfaces

Zaidi,S.H., Gee,J.M., Ruby,D.S., Brueck,S.R.J.

SPIE - The International Society for Optical Engineering
11 Conference Proceedings SPECKLE TECHNIQUES FOR NONCONTACT TEMPERATURE MEASUREMENT

Burckel, D., Zaidi, S. H., Lang, M. K., Frauenglass, A., Brueck, S. R. J.

MRS - Materials Research Society
6 Conference Proceedings Image reversal at nanometer scales

Zaidi,S.H., Chen,X., Brueck,S.R.J.

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Grating analysis of frequency parsing strategies for imaging interferometric lithography

Wu, E.S., Santhanam, B., Brueck, S.R.J.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12