MONITORING OF SILICON SURFACE AFTER REACTIVE ION ETCHING
- Author(s):
- Publication title:
- Proceedings of the Fourth International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 95-20
- Pub. Year:
- 1995
- Page(from):
- 184
- Page(to):
- 193
- Pages:
- 10
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771153 [1566771153]
- Language:
- English
- Call no.:
- E23400/962140
- Type:
- Conference Proceedings
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