High current injected charge-to-breakdown characteristics of thin gate oxide on SIMOX SOI having different buried oxide thicknesses
- Author(s):
- Publication title:
- Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 96-3
- Pub. Year:
- 1995
- Page(from):
- 330
- Page(to):
- 338
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566771535 [1566771536]
- Language:
- English
- Call no.:
- E23400/962142
- Type:
- Conference Proceedings
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