Low frequency noise sources in fully and partially depleted SOI MOSFETs from room to liquid helium temperatures

Low frequency noise sources in fully and partially depleted SOI MOSFETs from room to liquid helium temperatures

Author(s):

Publication title:

Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices

Title of ser.:

Electrochemical Society Proceedings Series

Ser. no.:

96-3

Pub. Year:

1995

Page(from):

248

Page(to):

254

Pub. info.:

Pennington, NJ: Electrochemical Society

ISSN:

01616374

ISBN:

9781566771535 [1566771536]

Language:

English

Call no.:

E23400/962142

Type:

Conference Proceedings

Details

TDL ID:	ZA00013813
Series ID:	PA00000028
Conf. info. (Name):	International Symposium on Silicon-on-Insulator Technology and Devices ; Electrochemical Society Meeting
Conf. info. (Number):	7th ; 187th
Conf. info. (Venue):	Los Angeles, California, USA
Conf. info. (Date):	1996.05.05-1996.05.10

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