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Wafer-scale replication and testing of micro-optical components for VCSELs

Author(s):
Gimkiewicz, C. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Moser, M. ( Avalon Photonics Ltd. (Switzerland) )
Obi, S. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Urban, C. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Pedersen, J.S. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Thiele, H. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Zschokke, C. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
Gale, M.T. ( Ctr. Suisse d'Electronique et de Microtechnique SA (Switzerland) )
3 more
Publication title:
Micro-optics, VCSELs, and photonic interconnects : 27-29 April 2004, Strasbourg, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5453
Pub. Year:
2004
Page(from):
13
Page(to):
26
Pages:
14
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453761 [0819453765]
Language:
English
Call no.:
P63600/5453
Type:
Conference Proceedings

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