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Advances in cryo-vacuum test capabilities for dual-band sensors at the kinetic kill vehicle hardware-in-the-loop simulation (KHILS) facility

Author(s):
Publication title:
Technologies for synthetic environments: hardware-in-the-loop testing IX : 13-14 April 2004, Oriando, Florida, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5408
Pub. Year:
2004
Page(from):
107
Page(to):
117
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453310 [0819453315]
Language:
English
Call no.:
P63600/5408
Type:
Conference Proceedings

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