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Characterization of InGaSb detectors for 1.0- to 2.4-μm applications

Author(s):
Refaat, T.F. ( Science and Technology Corp. (USA) )
Abedin, M.N. ( NASA Langley Research Ctr. (USA) )
Singh, U.N. ( NASA Langley Research Ctr. (USA) )
Bhagwat, V. ( Rensselaer Polytechnic Institute (USA) )
Bhat, I.B. ( Rensselaer Polytechnic Institute (USA) )
Dutta, P.S. ( Rensselaer Polytechnic Institute (USA) )
1 more
Publication title:
Infrared Technology and Applications XXX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5406
Pub. Year:
2004
Page(from):
56
Page(to):
63
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453297 [0819453293]
Language:
English
Call no.:
P63600/5406.1
Type:
Conference Proceedings

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