Characterization of InAlAs/InGaAs APD arrays for SWIR imaging applications
- Author(s):
Boisvert, J.C. ( Spectrolab, Inc. (USA) ) Masalykin, A. ( Spectrolab, Inc. (USA) ) Kinsey, G.S. ( Spectrolab, Inc. (USA) ) Isshiki, T. ( Spectrolab, Inc. (USA) ) Haddad, M. ( Spectrolab, Inc. (USA) ) Sudharsanan, R. ( Spectrolab, Inc. (USA) ) Zheng, X. ( Univ. of Texas/Austin (USA) ) Campbell, J.C. ( Univ. of Texas/Austin (USA) ) - Publication title:
- Infrared Technology and Applications XXX
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5406
- Pub. Year:
- 2004
- Page(from):
- 13
- Page(to):
- 20
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453297 [0819453293]
- Language:
- English
- Call no.:
- P63600/5406.1
- Type:
- Conference Proceedings
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