Blank Cover Image

GIS-based automated management of highway surface crack inspection system

Author(s):
Publication title:
Nondestructive detection and measurement for homeland security II : 16-17 March 2004, San Deigo, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5395
Pub. Year:
2004
Page(from):
70
Page(to):
81
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453129 [0819453129]
Language:
English
Call no.:
P63600/5395
Type:
Conference Proceedings

Similar Items:

Chung, H.C., Girardello, R., Soeller, T., Shinozuka, M.

SPIE-The International Society for Optical Engineering

Chung, H.-C., Enomoto, T., Loh, K., Shinozuka, M.

SPIE - The International Society of Optical Engineering

X. Hou, H. Wang, Q. Wang, Z. Wang

SPIE - The International Society of Optical Engineering

8 Conference Proceedings Highway crack monitoring system

Wu, M., Chen, X., Liu, R.

SPIE-The International Society for Optical Engineering

Shinozuka,M., Chung,H.-C., Liang,J.

SPIE - The International Society for Optical Engineering

T. Kjaelman, H. Peng, J. Travas-Sejdic, C. Soeller

SPIE - The International Society of Optical Engineering

K. Burkett, M.A. Ozbayoglu, C.H. Dagli

Society of Photo-optical Instrumentation Engineers

Chen, C.-J., Lai, S.-H., Lee, W.-H., Lin, C.-Y., Ku, T., Chen, C.-H., Chung, Y.-C.

SPIE - The International Society of Optical Engineering

Shinozuka,M., Chung,H.-C., Ichitsubo,M., Liang,J.

SPIE-The International Society for Optical Engineering

Aktan, A.E., Frangopol, D.M., Ghasemi, H., Shenton, H.W., Shinozuka, M., Madanat, S.

SPIE - The International Society of Optical Engineering

Chung, H., Park, C., Xie, Q., Chou, P., Shinozuka, M.

SPIE - The International Society of Optical Engineering

Unsal,C., Sukthankar,R., Thorpe,C.E.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12