Real-time visualization of bridge structural response through wireless MEMS sensors

Real-time visualization of bridge structural response through wireless MEMS sensors

Author(s):

Chung, H.-C. ( ImageCat, Inc. (USA) )
Enomoto, T. ( Univ. of California/Irvine (USA) )
Loh, K. ( Johns Hopkins Univ. (USA) )
Shinozuka, M. ( Univ. of California/Irvine (USA) )

Publication title:

Testing, Reliability, and Application of Micro- and Nano-Material Systems II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5392

Pub. Year:

2004

Page(from):

239

Page(to):

246

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453099 [0819453099]

Language:

English

Call no.:

P63600/5392

Type:

Conference Proceedings

Details

TDL ID:	ZA00013744
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures : Testing, Reliability, and Application of Micro-and Nano-Material Systems
Conf. info. (Number):	2004 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2004.03.15-2004.03.17

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