Structural damage identification using embedded sensitivity functions

Structural damage identification using embedded sensitivity functions

Author(s):

Johnson, T.J. ( Purdue Univ. (USA) )
Yang, C. ( Purdue Univ. (USA) )
Adams, D.E. ( Purdue Univ. (USA) )
Ciray, S. ( ArvinMeritor, Inc. (USA) )

Publication title:

Smart structures and materials 2004 : smart structures and integrated systems : 15-18 March 2004, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5390

Pub. Year:

2004

Page(from):

532

Page(to):

541

Pages:

10

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453075 [0819453072]

Language:

English

Call no.:

P63600/5390

Type:

Conference Proceedings

Details

TDL ID:	ZA00013742
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	2004
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2004.03.15-2004.03.18

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