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Damage detection by applying statistical methods to PZT impedance measurements

Author(s):
  • Allen, D.W. ( Virginia Polytechnic Institute and State Univ. (USA) )
  • Peairs, D.M. ( Virginia Polytechnic Institute and State Univ. (USA) )
  • Inman, D.J. ( Virginia Polytechnic Institute and State Univ. (USA) )
Publication title:
Smart structures and materials 2004 : smart structures and integrated systems : 15-18 March 2004, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5390
Pub. Year:
2004
Page(from):
513
Page(to):
520
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453075 [0819453072]
Language:
English
Call no.:
P63600/5390
Type:
Conference Proceedings

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