Interaction of oxygen vacancies with domain walls and its impact on fatigue in ferroelectric thin films

Interaction of oxygen vacancies with domain walls and its impact on fatigue in ferroelectric thin films

Author(s):

Xiao, Y. ( California Institute of Technology (USA) )
Bhattacharya, K. ( California Institute of Technology (USA) )

Publication title:

Smart structures and materials 2004 : active materials : behavior and mechanics : 15-18 March 2004, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5387

Pub. Year:

2004

Page(from):

354

Page(to):

365

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277789X

ISBN:

9780819453044 [0819453048]

Language:

English

Call no.:

P63600/5387

Type:

Conference Proceedings

Details

TDL ID:	ZA00013739
Series ID:	PA00000029
Conf. info. (Name):	Smart Structures and Materials
Conf. info. (Number):	2004
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2004.03.15-2004.03.18

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