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Key metrology considerations for fiber Bragg grating sensors

Author(s):
  • Dyer, S.D. ( National Institute of Standards and Technology (USA) )
  • Williams, P.A. ( National Institute of Standards and Technology (USA) )
  • Espejo, R.J. ( National Institute of Standards and Technology (USA) )
  • Kofler, J.D. ( National Institute of Standards and Technology (USA) )
  • Etzel, S.M. ( National Institute of Standards and Technology (USA) )
Publication title:
Smart structures and materials 2004 : smart sensor technology and measurement systems : 15-17 March 2004, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5384
Pub. Year:
2004
Page(from):
181
Page(to):
189
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453013 [0819453013]
Language:
English
Call no.:
P63600/5384
Type:
Conference Proceedings

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