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Modified procedure for evaluation of low-k1 process windows

Author(s):
  • Park, D.-W. ( Samsung Electronics Co., Ltd. (South Korea) )
  • Lee, S. ( Samsung Electronics Co., Ltd. (South Korea) )
  • Woo, S.-G. ( Samsung Electronics Co., Ltd. (South Korea) )
  • Cho, H.-K. ( Samsung Electronics Co., Ltd. (South Korea) )
  • Han, W.-S. ( Samsung Electronics Co., Ltd. (South Korea) )
Publication title:
Optical Microlithography XVII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5377
Pub. Year:
2004
Page(from):
1422
Page(to):
1426
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452900 [0819452904]
Language:
English
Call no.:
P63600/5377.3
Type:
Conference Proceedings

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