Advanced model formulations for optical and process proximity correction

Advanced model formulations for optical and process proximity correction

Author(s):

Beale, D.F. ( Synopsys, Inc. (USA) )
Shiely, J.P. ( Synopsys, Inc. (USA) )
Melvin, L.L., III ( Synopsys, Inc. (USA) )
Rieger, M.L. ( Synopsys, Inc. (USA) )

Publication title:

Optical Microlithography XVII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5377

Pub. Year:

2004

Page(from):

721

Page(to):

729

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452900 [0819452904]

Language:

English

Call no.:

P63600/5377.2

Type:

Conference Proceedings

Details

TDL ID:	ZA00013728
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Optical Microlithography
Conf. info. (Number):	2004 : 17th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2004.02.24-2004.02.27

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