Aerial image characterization for the defects in the extreme ultraviolet mask

Aerial image characterization for the defects in the extreme ultraviolet mask

Author(s):

Yoo, M.-S. ( Hanyang Univ. (South Korea) )
Park, S.-W. ( Hanyang Univ. (South Korea) )
Kim, J.-H. ( Hanyang Univ. (South Korea) )
Kwon, Y.-K. ( Hanyang Univ. (South Korea) )
Oh, H.-K. ( Hanyang Univ. (South Korea) )

Publication title:

Emerging Lithographic Technologies VIII

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5374

Pub. Year:

2004

Page(from):

751

Page(to):

759

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452870 [0819452874]

Language:

English

Call no.:

P63600/5374.2

Type:

Conference Proceedings

Details

TDL ID:	ZA00013722
Series ID:	PA00000029
Conf. info. (Name):	SPIE Advanced Lithography : Emerging Lithographic Technologies
Conf. info. (Number):	2004 : 8th
Conf. info. (Venue):	Santa Clara, CA, USA
Conf. info. (Date):	2004.02.24-2004.02.26

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