Blank Cover Image

New method to assess the registration of CT-MR images of the head

Author(s):
Publication title:
Medical Imaging 2004: Image Processing
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5370
Pub. Year:
2004
Page(from):
129
Page(to):
136
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
16057422
ISBN:
9780819452832 [0819452831]
Language:
English
Call no.:
P63600/5370.1
Type:
Conference Proceedings

Similar Items:

Styner, M.A., Charles, H.C., Park, J., Gerig, G.

SPIE-The International Society for Optical Engineering

Wei, M., Liu, J.

SPIE - The International Society of Optical Engineering

Chapuis, J., Rudolph, T., Borgesson, B., Momi, E.D., Pappas, I.P., Hallermann, W., Schramm, A., Caversaccio, M.

SPIE - The International Society of Optical Engineering

Jonic,S., Thevenaz,P., Unser,M.A.

SPIE-The International Society for Optical Engineering

X. Liu, A. Li, P. Gao, J. Tian, X. Peng

Society of Photo-optical Instrumentation Engineers

Noordmans,H.J., Rutten,G.J.M., Willems,P.W.A., Viergever,M.A.

SPIE - The International Society for Optical Engineering

A. Parraga, J. Pettersson, A. Susin, M. D. Craene, B. Macq

SPIE - The International Society of Optical Engineering

N. Papenberg, T. Lange, J. Modersitzki, P. M. Schlag, B. Fischer

Society of Photo-optical Instrumentation Engineers

Maurer,C.R.,Jr., Maciunas,R.J., Fitzpatrick,J.M.

SPIE-The International Society for Optical Engineering

Bax, M.R., Khadem, R., Johnson, J.A., Wilkinson, E.P., Shahidi, R.

SPIE-The International Society for Optical Engineering

Liu,Y.-H., Sun,Y.-N., Chiou,J.-I.

SPIE-The International Society for Optical Engineering

Makela,T., Clarysse,P., Lotjonen,J., Sipila,O., Hanninen,H., Nenonen,J., Lauerma,K., Knuuti,J., Katila,T., Magnin,I.E.

IOS Press

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12