Dose profile measurement of a four-dimensional CT (4D-CT) including scattered radiation
- Author(s):
- Endo, M. ( National Institute of Radiological Sciences (Japan) )
- Mori, S. ( National Institute of Radiological Sciences (Japan) )
- Tsunoo, T. ( National Institute of Radiological Sciences (Japan) )
- Nishizawa, K. ( National Institute of Radiological Sciences (Japan) )
- Aoyama, T. ( Nagoya Univ. School of Health Sciences (Japan) )
- Publication title:
- Medical Imaging 2004: Physics of Medical Imaging
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5368
- Pub. Year:
- 2004
- Page(from):
- 596
- Page(to):
- 609
- Pages:
- 14
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 16057422
- ISBN:
- 9780819452818 [0819452815]
- Language:
- English
- Call no.:
- P63600/5368.2
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Basic performance evaluation of the first model of four-dimensional CT scanner
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Respiratory-gated segment reconstruction for radiation treatment planning using 256-slice CT-scanner during free breathing
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
8
Conference Proceedings
A method for extracting multi-organ from four-phase contrasted CT images based on CT value distribution estimation using EM-algorithm
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Monte Carlo analysis of relation between patient dose and noise characteristic of a flat-panel detector for cone-beam CT
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Three-dimensional analysis of alveolar bone resorption by image processing of 3-D dental CT images [6144-54]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Surface figuring and measurement methods with spatial resolution close to 0.1 mm for x-ray mirror frabrication [5921-24]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |