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Field emission testing of carbon nanotubes for THz frequency vacuum microtube sources

Author(s):
Manohara, H.M. ( Jet Propulsion Lab. (USA) )
Dang, W.L. ( California Institute of Technology (USA) )
Siegel, P.H. ( Jet Propulsion Lab. (USA) )
Hoenk, M. ( Jet Propulsion Lab. (USA) )
Husain, A. ( California Institute of Technology (USA) )
Scherer, A. ( California Institute of Technology (USA) )
1 more
Publication title:
Reliability, Testing, and Characterization of MEMS/MOEMS III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5343
Pub. Year:
2004
Page(from):
227
Page(to):
234
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452511 [0819452513]
Language:
English
Call no.:
P63600/5343
Type:
Conference Proceedings

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