Torsional stress, fatigue and fracture strength in silicon hinges of a micro scanning mirror
- Author(s):
- Wolter, A. ( Fraunhofer-Institut fuer Photonische Mikrosysteme (Germany) )
- Schenk, H. ( Fraunhofer-Institut fuer Photonische Mikrosysteme (Germany) )
- Korth, H. ( Fraunhofer-Institut fuer Photonische Mikrosysteme (Germany) )
- Lakner, H. ( Fraunhofer-Institut fuer Photonische Mikrosysteme (Germany) )
- Publication title:
- Reliability, Testing, and Characterization of MEMS/MOEMS III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5343
- Pub. Year:
- 2004
- Page(from):
- 176
- Page(to):
- 185
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452511 [0819452513]
- Language:
- English
- Call no.:
- P63600/5343
- Type:
- Conference Proceedings
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