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Reliability issues of an accelerometer under environmental stresses

Author(s):
Schmitt, P. ( Ctr. National d'Etudes Spatiales (France) and LAAS-CNRS (France) )
Pressecq, F. ( Ctr. National d'Etudes Spatiales (France) )
Perez, G. ( Ctr. National d'Etudes Spatiales (France) )
Lafontan, X. ( Nova MEMS (France) )
Nicot, J.M. ( Ctr. National d'Etudes Spatiales (France) )
Esteve, D. ( LAAS-CNRS (France) )
Fourniols, J.Y. ( LAAS-CNRS (France) )
Camon, H. ( LAAS-CNRS (France) )
Oudea, C. ( EADS (France) )
4 more
Publication title:
Reliability, Testing, and Characterization of MEMS/MOEMS III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5343
Pub. Year:
2004
Page(from):
22
Page(to):
30
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452511 [0819452513]
Language:
English
Call no.:
P63600/5343
Type:
Conference Proceedings

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