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Effect of deposition parameters on the stress gradient of CVD and PECVD poly-SiGe for MEMS applications

Author(s):
Van der Donck, T. ( IMEC (Belgium) and Katholieke Univ. Leuven (Belgium) )
Proost, J. ( Katholieke Univ. Leuven (Belgium) )
Rusu, C. ( IMEC (Belgium) )
Baert, K. ( IMEC (Belgium) )
Van Hoof, C. ( IMEC (Belgium) )
Celis, J.-P. ( Katholieke Univ. Leuven (Belgium) )
Witvrouw, A. ( IMEC (Belgium) )
2 more
Publication title:
Micromachining and Microfabrication Process Technology IX
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5342
Pub. Year:
2004
Page(from):
8
Page(to):
18
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452504 [0819452505]
Language:
English
Call no.:
P63600/5342
Type:
Conference Proceedings

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