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Diode array reliability experiment

Author(s):
Gallant, D. ( Boeing Co. (USA) )  
Publication title:
High-Power Diode Laser Technology and Applications II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5336
Pub. Year:
2004
Page(from):
212
Page(to):
217
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452443 [0819452440]
Language:
English
Call no.:
P63600/5336
Type:
Conference Proceedings

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