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A calibration method using only one plane for 3D machine vision

Author(s):
  • Deng, S. ( Hefei Univ. of Technology (China) )
  • Yang, Y. ( Hefei Univ. of Technology (China) )
  • Wang, X. ( Hefei Univ. of Technology (China) )
Publication title:
Machine Vision Applications in Industrial Inspection XII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5303
Pub. Year:
2004
Page(from):
52
Page(to):
63
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452061 [0819452068]
Language:
English
Call no.:
P63600/5303
Type:
Conference Proceedings

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