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Two-phase full-frame CCD with double ITO gate structure for increased sensitivity

Author(s):
Des Jardin, W. ( Eastman Kodak Co. (USA) )
Kosman, S. ( Eastman Kodak Co. (USA) )
Kurfiss, N. ( Eastman Kodak Co. (USA) )
Johnson, J. ( Eastman Kodak Co. (USA) )
Losee, D. ( Eastman Kodak Co. (USA) )
Putnam, G.G. ( Eastman Kodak Co. (USA) )
Tanbakuchi, A. ( Eastman Kodak Co. (USA) )
2 more
Publication title:
Sensors and camera systems for scientific, industrial, and digital photography applications V : 19-21 January, 2004, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5301
Pub. Year:
2004
Page(from):
59
Page(to):
66
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819452047 [0819452041]
Language:
English
Call no.:
P63600/5301
Type:
Conference Proceedings

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