Feature extraction by best anisotropic Haar bases in an OCR system

Feature extraction by best anisotropic Haar bases in an OCR system

Author(s):

Gotchev, A.P. ( Tampere Univ. of Technology (Finland) )
Rusanovskyy, D. ( Tampere Univ. of Technology (Finland) )
Popov, R. ( Nokia Research Ctr. (United Kingdom) )
Egiazarian, K.O. ( Tampere Univ. of Technology (Finland) )
Astola, J.T. ( Tampere Univ. of Technology (Finland) )

Publication title:

Image processing : algorithms and systems III : 19-21 January 2004, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5298

Pub. Year:

2004

Page(from):

504

Page(to):

515

Pages:

12

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819452016 [0819452017]

Language:

English

Call no.:

P63600/5298

Type:

Conference Proceedings

Details

TDL ID:	ZA00013642
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image processing
Conf. info. (Number):	2004 : 3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2004.01.19-2004.01.21

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